The IMPLEMENTATION OF TEMPERATURE SENSOR THREE POINTS VOLTAGE CALIBRATION USING LINEAR EQUATION METHODOLOGY ON C90NM MICROCONTROLLER (MPC5674F) FOR TEST YIELD IMPROVEMENTS

Semiconductor Test And Measurement

Authors

  • Nicholas Fung 012-3111562

Abstract

This paper study the problems related to the current methodology of temperature sensor two-points voltage calibration on MPC5674F microcontroller where this current method is ineffective leading to package test low yield of temperature sensor test. The focus on this paper is about implementing a new methodology known as the temperature sensor three-points voltage calibration by using a linear coefficients concept, where the method is to apply a fixed slope of temperature response base on one control room temperature from wafer level probe to determine the hot and cold temperature voltage at package test with C++ test program code. The current production data shows the calibrated temperature sensor not within ±10°C accuracy in the temperature range of 25°C to 145°C based on current methodology. To implement new methodology, characterization work were carried out using good units on three different slopes 25°C to -40°C, 25°C to 100°C and 100°C to -40°C. The best fit slope 100°C to -40°C results of 0.006055v was selected to use for the temperature sensor three-points voltage calibration methodology to represent the actual operating condition of microcontroller at temperature range of -45°C to 145°C due to its consistency at temperature range. Yield and analysis results are discussed using the new methodology to evaluate the improvements which can reduce the scrap cost.

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Published

2022-12-31

How to Cite

Fung, N. (2022). The IMPLEMENTATION OF TEMPERATURE SENSOR THREE POINTS VOLTAGE CALIBRATION USING LINEAR EQUATION METHODOLOGY ON C90NM MICROCONTROLLER (MPC5674F) FOR TEST YIELD IMPROVEMENTS: Semiconductor Test And Measurement. Journal of Energy and Environment, 14. Retrieved from https://journal.uniten.edu.my/index.php/jee/article/view/248

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